(光)电子能谱法
the structure of the thin film was characterized by means of fourier transform infrared spectrometry, x ray photoelectron spectrometry, x ray diffraction, and transmission electron microscopy.
采用X射线衍射仪、傅立叶红外光谱仪、X射线光电子能谱仪及透射电子显微镜等对薄膜结构进行了表征。
The atomization mechanism of europium nitrate on graphite probe surface in graphite furnace was investigated experimentally by X-ray diffraction spectrometry and X-ray photoelectron spectrometry.
用X-射线衍射分析与X-射线光电子能谱分析研究了硝酸铕在石墨炉内石墨探针表面原子化机理。
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